Source Features

MIPI Monitor Feature (0x305)

MIPI Monitor Declaration

Feature ID

0x305

Version

0x001

(0.1)

Pointer Count

2

Bootstrap ID

0x30500102

(Max pointers)

Pointer 0

Reg Block

MIPI Monitor Block

Pointer 1

String

Description

MIPI Monitor Registers

Pointer 0 points to a block of 4 contiguous registers.

Register Offset 0 — Activity

MIPI Activity Register

PCx16

Unused

CActive

CCont

L0A

L1A

L2A

L3A

V0A

V1A

V2A

V3A

Register Offset 4 — LineInfo

MIPI LineInfo Register

PixelClockCount

Bytes Per Line

Register Offset 8 — LineCount

MIPI LineCount Register

Unused

LineCount

Register Offset 0xC — DataType

MIPI DataType Register

U

DType0

U

DType1

U

DType2

U

DType3

Test Pattern Generator (0x310)

Test Pattern Generator

Feature ID

0x310

Version

0x001

(0.1)

Pointer Count

8

Bootstrap ID

0x31000108

(Max pointers)

Pointer 0

String

Description

Pointer 1

Reg 32

Applicable Streams (bit-field)

Pointer 2

Reg 32

Test Pattern Mode Register

Pointer 3

Reg 32

Test Pattern Mode Count

Pointer 4

Strings

Test Pattern Mode 0 Description

Pointer 5

Reg 32

Test Pattern Param Count

Pointer 6

Strings

Test Pattern Param 0 Description

Pointer 7

Reg 32

Test Pattern Parameter 0

Description (Pointer 0)

User-defined null-terminated string that describes this test pattern generator.

Applicable Streams (Pointer 1)

Bit-field indicating which streams include this test pattern generator (bit 0 = stream 0, etc.).

All streams marked available use the same register settings for this generator.

Test Pattern Mode Register (Pointer 2)

Read / Write Register to set the test pattern generator mode.

0 always disables the generator and enables the alternative stream.

Test Pattern Mode Count (Pointer 3)

Count of functional test pattern modes.

Test Pattern Mode x Description (Pointer 4 + offset from prior string)

User-defined list of null-terminated 32-bit word-aligned strings that describe each of the test pattern modes.

The mode 0 description should indicate "off" or "bypass".

Test Pattern Parameter Count (Pointer 5)

Count of available test pattern parameters.

Test Pattern Parameter Descriptions (Pointer 6 + offset from prior string)

User-defined null-terminated 32-bit word-aligned strings that describe each available parameter.

Test Pattern Parameter Registers (Pointer 7 + n)

Read / Write registers for the specified test pattern parameters.